Fault Classification on Melamine Faced Panels Using Local Binary Pattern

Fernando P.G. De Sa, Cristhian Aguilera, Cristhian A. Aguilera, Aura Conci

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

The wood-based industry is the focus of users that require changes towards a clean industry, environmentally friendly and with efficient use of natural resources. Tasks of inspection and quality control are essential in this scenario. In this work, a dataset with samples obtained from near-infrared (NIR) image acquisition is used to evaluate the limits of the local binary pattern (LBP) for quality control of melamine board products. Conventional pattern recognition and convolutional neural network (CNN) approaches are compared concerning their use to classify the most common groups of faults present on the plant for the inspection task. The local binary convolutional neural networks (LBCNN) is used for inspecting, in a CNN inspired by the traditional LBP texture descriptor. The work shows that such a reformulation of the standard LBP is very simple and enables similar results. However, the results present better performance when LBP is combined with another type of feature, even only based on intensity. Similar modifications of standard CNN can be tested to promote the development of new CNN models insensible to texture granularity, image resolution, intensity range, and other variations of the acquired samples.

Idioma originalInglés
Título de la publicación alojadaProceedings - 2022 35th Conference on Graphics, Patterns, and Images, SIBGRAPI 2022
EditoresBruno Motta de Carvalho, Luiz Marcos Garcia Goncalves
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas222-227
Número de páginas6
ISBN (versión digital)9781665453851
DOI
EstadoPublicada - 2022
Publicado de forma externa
Evento35th Conference on Graphics, Patterns, and Images, SIBGRAPI 2022 - Natal, Brasil
Duración: 20222022

Serie de la publicación

NombreProceedings - 2022 35th Conference on Graphics, Patterns, and Images, SIBGRAPI 2022

Conferencia

Conferencia35th Conference on Graphics, Patterns, and Images, SIBGRAPI 2022
País/TerritorioBrasil
CiudadNatal
Período24/10/2227/10/22

Nota bibliográfica

Funding Information:
ACKNOWLEDGEMENT We acknowledge to the CYTED Network ”Ibero-American Thematic Network on ICT Applications for Smart Cities”, Grant No.: 518RT0559. F.P.G.S. and A.C. express their gratitude to the Brazilian Agencies FAPERJ, CAPES and CNPq under projects CNE. PRINT and 305416/2018-9, respectively.

Publisher Copyright:
© 2022 IEEE.

Áreas temáticas de ASJC Scopus

  • Artes plásticas y escénicas
  • Inteligencia artificial
  • Infografía y diseno asistido por ordenador
  • Informática aplicada
  • Visión artificial y reconocimiento de patrones

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