Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise

J. Lermanda; Sergio N. Torres; Pablo A. Coelho

doi:10.1109/CHILECON60335.2023.10418661

Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise

J. Lermanda, Sergio N. Torres, Pablo A. Coelho

Universidad de Concepción

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

Resumen

The areas in which the Infrared (IR) spectrum gives vital information are as different as they are unique. However, this versatility comes with limitations. One of these obstacles is how to deal with the noise that affects this spectrum, which heavily distorts the data acquired from a scene. This investigation centers itself around how to fix the Fixed Pattern Noise (FPN) in the Short Wave Infrared (SWIR) using a refocusing algorithm, as an alternative of the two point black body calibration. Plants are chosen because of the ease to identify hidric stress in them using IR imaging due to the water natural reflectance and absorbance properties. The elimination of noise using this method will be revised, comparing it to the well known two point calibration method. Furthermore, by using filters a multispectral cube will be created and a spectral range of interest within the SWIR will be defined.

Idioma original	Inglés
Título de la publicación alojada	ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies
Editorial	Institute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)	9798350369533
DOI	https://doi.org/10.1109/CHILECON60335.2023.10418661
Estado	Publicada - 2023
Evento	2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon 2023 - Hybrid, Valdivia, Chile Duración: 2023 → 2023

Serie de la publicación

Nombre	Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon
ISSN (versión impresa)	2832-1529
ISSN (versión digital)	2832-1537

Conferencia

Conferencia	2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon 2023
País/Territorio	Chile
Ciudad	Hybrid, Valdivia
Período	05/12/23 → 07/12/23

Nota bibliográfica

Publisher Copyright:
© 2023 IEEE.

Áreas temáticas de ASJC Scopus

Inteligencia artificial
Redes de ordenadores y comunicaciones
Hardware y arquitectura
Sistemas de información
Gestión y sistemas de información
Ingeniería energética y tecnologías de la energía
Ingeniería eléctrica y electrónica
Control y optimización

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10.1109/CHILECON60335.2023.10418661

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Lermanda, J., Torres, S. N., & Coelho, P. A. (2023). Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise. En ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CHILECON60335.2023.10418661

Lermanda, J. ; Torres, Sergio N. ; Coelho, Pablo A. / Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise. ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon).

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title = "Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise",

abstract = "The areas in which the Infrared (IR) spectrum gives vital information are as different as they are unique. However, this versatility comes with limitations. One of these obstacles is how to deal with the noise that affects this spectrum, which heavily distorts the data acquired from a scene. This investigation centers itself around how to fix the Fixed Pattern Noise (FPN) in the Short Wave Infrared (SWIR) using a refocusing algorithm, as an alternative of the two point black body calibration. Plants are chosen because of the ease to identify hidric stress in them using IR imaging due to the water natural reflectance and absorbance properties. The elimination of noise using this method will be revised, comparing it to the well known two point calibration method. Furthermore, by using filters a multispectral cube will be created and a spectral range of interest within the SWIR will be defined.",

keywords = "FPN, lightfield, multispectral, plant, refocusing",

author = "J. Lermanda and Torres, {Sergio N.} and Coelho, {Pablo A.}",

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year = "2023",

doi = "10.1109/CHILECON60335.2023.10418661",

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Lermanda, J, Torres, SN & Coelho, PA 2023, Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise. En ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies. Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon, Institute of Electrical and Electronics Engineers Inc., 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon 2023, Hybrid, Valdivia, Chile, 05/12/23. https://doi.org/10.1109/CHILECON60335.2023.10418661

Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise. / Lermanda, J.; Torres, Sergio N.; Coelho, Pablo A.
ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon).

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

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N2 - The areas in which the Infrared (IR) spectrum gives vital information are as different as they are unique. However, this versatility comes with limitations. One of these obstacles is how to deal with the noise that affects this spectrum, which heavily distorts the data acquired from a scene. This investigation centers itself around how to fix the Fixed Pattern Noise (FPN) in the Short Wave Infrared (SWIR) using a refocusing algorithm, as an alternative of the two point black body calibration. Plants are chosen because of the ease to identify hidric stress in them using IR imaging due to the water natural reflectance and absorbance properties. The elimination of noise using this method will be revised, comparing it to the well known two point calibration method. Furthermore, by using filters a multispectral cube will be created and a spectral range of interest within the SWIR will be defined.

AB - The areas in which the Infrared (IR) spectrum gives vital information are as different as they are unique. However, this versatility comes with limitations. One of these obstacles is how to deal with the noise that affects this spectrum, which heavily distorts the data acquired from a scene. This investigation centers itself around how to fix the Fixed Pattern Noise (FPN) in the Short Wave Infrared (SWIR) using a refocusing algorithm, as an alternative of the two point black body calibration. Plants are chosen because of the ease to identify hidric stress in them using IR imaging due to the water natural reflectance and absorbance properties. The elimination of noise using this method will be revised, comparing it to the well known two point calibration method. Furthermore, by using filters a multispectral cube will be created and a spectral range of interest within the SWIR will be defined.

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Lermanda J, Torres SN, Coelho PA. Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise. En ChileCon 2023 - 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies. Institute of Electrical and Electronics Engineers Inc. 2023. (Proceedings - IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies, ChileCon). doi: 10.1109/CHILECON60335.2023.10418661

Hidric Stress Analysis of Plants Using an Infrared Plenoptic Imaging System Free of Fixed Pattern Noise

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