Abstract
A study on the classification of copper concentrates relevant to the copper refining industry is performed by means of reflectance hyperspectral images in the visible and near infrared (VIS-NIR) bands (400-1000 nm) and in the short-wave infrared (SWIR) (900-1700 nm) band. A total of 82 copper concentrate samples were press compacted into 13-mm-diameter pellets, and their mineralogical composition was characterized via quantitative evaluation of minerals and scanning electron microscopy. The most representative minerals contained in these pellets are bornite, chalcopyrite, covelline, enargite, and pyrite. Three databases (VIS-NIR, SWIR, and VIS-NIR-SWIR) containing a collection of average reflectance spectra computed from 9 × 9 pixel neighborhoods in each pellet hyperspectral image are compiled to train the classification models. The classification models tested in this work are a linear discriminant classifier and two non-linear classifiers, a quadratic discriminant classifier, and a fine K-nearest neighbor classifier (FKNNC). The results obtained show that the joint use of VIS-NIR and SWIR bands allows for the accurate classification of similar copper concentrates that contain only minor differences in their mineralogical composition. Specifically, among the three tested classification models, the FKNNC performs the best in terms of overall classification accuracy, achieving 93.4% accuracy in the test set when only VIS-NIR data are used to construct the classification model, up to 80.5% using only SWIR data, and up to 97.6% using both VIS-NIR and SWIR bands together.
Original language | English |
---|---|
Pages (from-to) | 2970-2977 |
Number of pages | 8 |
Journal | Applied Optics |
Volume | 62 |
Issue number | 12 |
DOIs | |
State | Published - 2023 |
Bibliographical note
Funding Information:Claudio Sandoval acknowledges the support of the
Publisher Copyright:
© 2023 Optica Publishing Group.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering